Method and Apparatus for Profiling DNA Specimen
Novel method and apparatus for profiling dna specimen using electronics is described. The method comprises: providing a metal layer; providing a dna specimen layer adjacent to metal layer to form schottky junction; providing forward bias voltage to the schottky junction and collecting current over voltage (i-v) profile of schottky junction. I-v profile of various dna can be collected to build a dna database. This database can be used to identify unknown dna specimen. An apparatus is provided to profile dna specimen comprising: metal layer; the dna specimen adjacent to metal layer to form schottky junction, a forward bias voltage provider rectifies the schottky junction and a monitor collects current over voltage profile of schottky junction.
Contact person for this offer:
ChM Dr. Lee Ching Shya, PhD (Dual), RTTP
Technology Transfer Manager
Tel: +603-7967-7351/ 013-2250151