top of page
TAWARAN TEKNIK

Method and Apparatus for Profiling DNA Specimen

TINJAUAN TEKNOLOGI

Novel method and apparatus for profiling dna specimen using electronics is described. The method comprises: providing a metal layer; providing a dna specimen layer adjacent to metal layer to form schottky junction; providing forward bias voltage to the schottky junction and collecting current over voltage (i-v) profile of schottky junction. I-v profile of various dna can be collected to build a dna database. This database can be used to identify unknown dna specimen. An apparatus is provided to profile dna specimen comprising: metal layer; the dna specimen adjacent to metal layer to form schottky junction, a forward bias voltage provider rectifies the schottky junction and a monitor collects current over voltage profile of schottky junction.

Mega - Trend

Innovative Technologies of the Future, Healthcare

Tahap Kesediaan Teknologi (TRL)

TRL 3

Nombor Paten

PI 2015703987

Dapatkan helaian fakta teknologi di sini:

Orang yang boleh dihubungi untuk tawaran ini:

Lee Ching Shya

Pegawai Perniagaan UMCIC Universiti Malaya

e-mel:  leecs@um.edu.my

Tel: +603-7967-7351/7352

MAKLUMAT LANJUT

Anda mempunyai soalan untuk mengetahui tentang teknologi atau kerjasama? 
Sila hubungi kami:

+603 - 7967 7351

bottom of page